Fig. 3From: A graphene film interlayer for enhanced electrical conductivity in a carbon-fibre/PEEK compositeControl substrate of highly boron doped Si wafer (a) optically imaged and (b) surface mapped using WLI. Graphene thin film deposited onto highly boron doped Si wafer substrate (c) optically imaged and the respective (d) WLI surface map. (e) Optical image of CF-PEEK control substrate and (f) WLI map and the addition of the (g) thin film onto CF-PEEK optically imaged and (h) WLI surface mappedBack to article page